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(parent: 55c72ab) | patch
tools/testing/nvdimm: support nfit_test_dimm attributes under nfit_test.1
authorDan Williams <dan.j.williams@intel.com>
Mon, 9 Apr 2018 23:38:01 +0000 (16:38 -0700)
committerDan Williams <dan.j.williams@intel.com>
Mon, 16 Apr 2018 15:18:51 +0000 (08:18 -0700)
commit718fda67d2f69cc6074b4b6a740a6e4aacd44eff
treeec82661354af990009bcf688c528624d527e7eeftree | snapshot
parent55c72ab62e47fc584131901baddb2752e949ebcdcommit | diff
tools/testing/nvdimm: support nfit_test_dimm attributes under nfit_test.1

The nfit_test.1 bus provides a pmem topology without blk-aperture
enabling, so it presents different failure modes for label space
handling. Allow custom DSM command error injection.

Signed-off-by: Dan Williams <dan.j.williams@intel.com>
tools/testing/nvdimm/test/nfit.c diff | blob | history
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