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xfs/422: rework feature detection so we only test-format scratch once
authorDarrick J. Wong <djwong@kernel.org>
Fri, 30 Dec 2022 22:12:53 +0000 (14:12 -0800)
committerZorro Lang <zlang@kernel.org>
Sat, 14 Jan 2023 13:46:58 +0000 (21:46 +0800)
commit8726d00c07a90c77cae2fb75a00df8fe30a6dc5b
tree21618be76a576769876ecbed441074a8c67a1d8btree | snapshot
parent7594bbb51c870c320f5e7a18c46825e0272751e0commit | diff
xfs/422: rework feature detection so we only test-format scratch once

Rework the feature detection in the one online fsck stress test so that
we only format the scratch device twice per test run.

Signed-off-by: Darrick J. Wong <djwong@kernel.org>
Reviewed-by: Zorro Lang <zlang@redhat.com>
Signed-off-by: Zorro Lang <zlang@kernel.org>
tests/xfs/422 diff | blob | history
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