]> git.apps.os.sepia.ceph.com Git - xfstests-dev.git/commit
generic: drop test 472
authorTheodore Ts'o <tytso@mit.edu>
Sun, 20 May 2018 19:46:08 +0000 (15:46 -0400)
committerEryu Guan <guaneryu@gmail.com>
Mon, 21 May 2018 08:20:00 +0000 (16:20 +0800)
commit8a8be5f0aba9fe166663665eb41a67bb929356a4
tree17fe2bb269c131fd46ef1ae18c3adb43c80c2dec
parent1410a2054f077c08eb80a3fe4125318916abf1f7
generic: drop test 472

From Goldwyn Rodrigues <rgoldwyn@suse.de>:

   "From earlier discussions, In between errors of a direct I/O cannot
   be handled correctly and may need a lot of tracking that it is not
   worth performing.

   It would be better to drop this test case and add in the documentation
   that a direct I/O error could mean that the write() may or may not have
   occurred and underlying data may be inconsistent."

Signed-off-by: Theodore Ts'o <tytso@mit.edu>
Reviewed-by: Eryu Guan <guaneryu@gmail.com>
Signed-off-by: Eryu Guan <guaneryu@gmail.com>
tests/generic/472 [deleted file]
tests/generic/472.out [deleted file]
tests/generic/group