git.apps.os.sepia.ceph.com Git - ceph-client.git/commit

]> git.apps.os.sepia.ceph.com Git - ceph-client.git/commit

author	Yi Liu <yi.l.liu@intel.com>
	Fri, 21 Mar 2025 17:19:39 +0000 (10:19 -0700)
committer	Jason Gunthorpe <jgg@nvidia.com>
	Tue, 25 Mar 2025 13:18:31 +0000 (10:18 -0300)
commit	c1b52b0a97aeae22462496cda064323255d10b3b
tree	7cdbb8441de71d5e7fb204e78d7f2631fde569c1	tree \| snapshot
parent	068e14025158986842f783147f9e41a59fbc97cd	commit \| diff

iommufd/selftest: Add test ops to test pasid attach/detach

This adds 4 test ops for pasid attach/replace/detach testing. There are
ops to attach/detach pasid, and also op to check the attached hwpt of a
pasid.

Link: https://patch.msgid.link/r/20250321171940.7213-18-yi.l.liu@intel.com
Reviewed-by: Kevin Tian <kevin.tian@intel.com>
Signed-off-by: Yi Liu <yi.l.liu@intel.com>
Tested-by: Nicolin Chen <nicolinc@nvidia.com>
Signed-off-by: Jason Gunthorpe <jgg@nvidia.com>

drivers/iommu/iommufd/iommufd_test.h		diff \| blob \| history
drivers/iommu/iommufd/selftest.c		diff \| blob \| history

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