]> git.apps.os.sepia.ceph.com Git - xfstests-dev.git/commit
generic: test I/O on dm error device
authorEryu Guan <eguan@redhat.com>
Wed, 23 Mar 2016 06:39:11 +0000 (17:39 +1100)
committerDave Chinner <david@fromorbit.com>
Wed, 23 Mar 2016 06:39:11 +0000 (17:39 +1100)
commitd00a869c2ebc7e9d3f2a3d7d0ba825a7df6216ab
tree0166c08a4ea23cd78212e705ba890576b776ae8a
parenta78397fa3acef7e5d02e5d121f371391375e0db0
generic: test I/O on dm error device

This is a test that performs simple I/O on dm error device, which
returns EIO on all I/O request.

This is motivated by an ext4 bug that crashes kernel on error path when
trying to update atime. Following kernel patch should fix the issue

  ext4: fix NULL pointer dereference in ext4_mark_inode_dirty()

Signed-off-by: Eryu Guan <eguan@redhat.com>
Reviewed-by: Dave Chinner <dchinner@redhat.com>
Signed-off-by: Dave Chinner <david@fromorbit.com>
tests/generic/338 [new file with mode: 0755]
tests/generic/338.out [new file with mode: 0644]
tests/generic/group