xfs/422: rework feature detection so we only test-format scratch once

Rework the feature detection in the one online fsck stress test so that
we only format the scratch device twice per test run.

Signed-off-by: Darrick J. Wong <djwong@kernel.org>
Reviewed-by: Zorro Lang <zlang@redhat.com>
Signed-off-by: Zorro Lang <zlang@kernel.org>

diff --git a/tests/xfs/422 b/tests/xfs/422
index 0bf08572f35dbd1d0d6ac9f30e09e9a6b2278103..b3353d2202e3cdccbfd3069f8134f6fbb52caa89 100755 (executable)
--- a/tests/xfs/422
+++ b/tests/xfs/422
@@ -25,11 +25,12 @@ _register_cleanup "_cleanup" BUS
 
 # real QA test starts here
 _supported_fs xfs
-_require_xfs_scratch_rmapbt
+_require_scratch
 _require_xfs_stress_online_repair
 
 _scratch_mkfs > "$seqres.full" 2>&1
 _scratch_mount
+_require_xfs_has_feature "$SCRATCH_MNT" rmapbt
 _scratch_xfs_stress_online_repair
 
 # success, all done