#! /bin/bash # SPDX-License-Identifier: GPL-2.0 # # FSQA Test No. 300 # # AIO/DIO stress test # Run random AIO/DIO activity and fallocate/punch_hole simultaneously # Test will operate on huge sparsed file so ENOSPC is expected. # seq=`basename $0` seqres=$RESULT_DIR/$seq echo "QA output created by $seq" here=`pwd` tmp=/tmp/$$ fio_config=$tmp.fio fio_out=$tmp.fio.out status=1 # failure is the default! trap "_cleanup; exit \$status" 0 1 2 3 15 _cleanup() { cd / rm -f $tmp.* } # get standard environment, filters and checks . ./common/rc . ./common/filter # real QA test starts here _supported_fs generic _require_scratch _require_odirect _require_aio _require_block_device $SCRATCH_DEV # xfs_io is not required for this test, but it's the best way to verify # the test system supports fallocate() for allocation and hole punching _require_xfs_io_command "falloc" _require_xfs_io_command "fpunch" rm -f $seqres.full NUM_JOBS=$((4*LOAD_FACTOR)) BLK_DEV_SIZE=`blockdev --getsz $SCRATCH_DEV` if [ $((BLK_DEV_SIZE)) -gt 1048576 ]; then BLK_DEV_SIZE=1048576 fi FS_SIZE=$((BLK_DEV_SIZE * 512)) cat >$fio_config <> $seqres.full 2>&1 _scratch_mount echo "" echo "Run fio with random aio-dio pattern" echo "" cat $fio_config >> $seqres.full $FIO_PROG $fio_config --output=$fio_out cat $fio_out >> $seqres.full status=0 exit