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(parent: 5635b68) | patch
xfstests: always use test option when checking large scratch device
authorDave Chinner <dchinner@redhat.com>
Fri, 15 Mar 2013 11:53:26 +0000 (11:53 +0000)
committerRich Johnston <rjohnston@sgi.com>
Tue, 19 Mar 2013 20:16:13 +0000 (15:16 -0500)
commit549ec4ae72869769126062b86e99648f9ea127d5
treeeee4052a0023e5ed6cc67aa5a5ab99bafeb92961tree | snapshot
parent5635b681d407d2f59663c3821c32c8996597cd98commit | diff
xfstests: always use test option when checking large scratch device

Some tests call _check_scratch_device directly and when using a
large filesystem this needs to run with a -t option to avoid
consuming large amounts of memory. Make this happen in all cases
that the scratch device is checked.

Signed-off-by: Dave Chinner <dchinner@redhat.com>
Reviewed-by: Christoph Hellwig <hch@lst.de>
Reviewed-by: Rich Johnston <rjohnston@sgi.com>
Signed-off-by: Rich Johnston <rjohnston@sgi.com>
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